DocumentCode
953634
Title
High solder-reflow crack resistant molding compound
Author
Gallo, Anthony A. ; Tubbs, Tara R.
Author_Institution
Dexter Corp., Olean, NY, USA
Volume
18
Issue
3
fYear
1995
fDate
9/1/1995 12:00:00 AM
Firstpage
646
Lastpage
649
Abstract
A variety of epoxy resins, filler mixtures, and adhesion additives were examined in semiconductor molding compounds for solder-reflow crack resistance (popcorn crack resistance). A limited comparison of molding compound high temperature strength properties and extent of popcorn cracking suggests no strong positive correlation. On the other hand, factors that might have an impact on adhesive properties of the molding compound, such as Low melt viscosity resins and putative adhesion additives appear to have the greatest impact. A molding compound developed with these factors showed no internal or external cracks on 84 Lead QFP´s (29.2×29.2×3.68 mm) after 72 h of 85°C/85% R.H. and one 10-s solder dip at 260°C. Nor were any external cracks observed after 168 h of 85°C/85% R.H. and one solder dip. However, minor internal cracks were observed
Keywords
adhesion; cracks; integrated circuit packaging; reflow soldering; semiconductor device packaging; surface mount technology; thermal stress cracking; QFP; adhesion additives; adhesive properties; epoxy resins; filler mixtures; high temperature strength properties; low melt viscosity resins; popcorn crack resistance; semiconductor molding compounds; solder-reflow crack resistant compound; Additives; Adhesives; Epoxy resins; Immune system; Lead; Moisture; Packaging; Silicon compounds; Temperature; Viscosity;
fLanguage
English
Journal_Title
Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
Publisher
ieee
ISSN
1070-9886
Type
jour
DOI
10.1109/95.465164
Filename
465164
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