• DocumentCode
    953634
  • Title

    High solder-reflow crack resistant molding compound

  • Author

    Gallo, Anthony A. ; Tubbs, Tara R.

  • Author_Institution
    Dexter Corp., Olean, NY, USA
  • Volume
    18
  • Issue
    3
  • fYear
    1995
  • fDate
    9/1/1995 12:00:00 AM
  • Firstpage
    646
  • Lastpage
    649
  • Abstract
    A variety of epoxy resins, filler mixtures, and adhesion additives were examined in semiconductor molding compounds for solder-reflow crack resistance (popcorn crack resistance). A limited comparison of molding compound high temperature strength properties and extent of popcorn cracking suggests no strong positive correlation. On the other hand, factors that might have an impact on adhesive properties of the molding compound, such as Low melt viscosity resins and putative adhesion additives appear to have the greatest impact. A molding compound developed with these factors showed no internal or external cracks on 84 Lead QFP´s (29.2×29.2×3.68 mm) after 72 h of 85°C/85% R.H. and one 10-s solder dip at 260°C. Nor were any external cracks observed after 168 h of 85°C/85% R.H. and one solder dip. However, minor internal cracks were observed
  • Keywords
    adhesion; cracks; integrated circuit packaging; reflow soldering; semiconductor device packaging; surface mount technology; thermal stress cracking; QFP; adhesion additives; adhesive properties; epoxy resins; filler mixtures; high temperature strength properties; low melt viscosity resins; popcorn crack resistance; semiconductor molding compounds; solder-reflow crack resistant compound; Additives; Adhesives; Epoxy resins; Immune system; Lead; Moisture; Packaging; Silicon compounds; Temperature; Viscosity;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9886
  • Type

    jour

  • DOI
    10.1109/95.465164
  • Filename
    465164