• DocumentCode
    953642
  • Title

    Information Bandwidth Problems in Instrumentation of Missile Flight Tests

  • Author

    Mimmack, William E.

  • Author_Institution
    Range Instrumentation Dev. Div., White Sands Missile Range, N. Mex.
  • Issue
    4
  • fYear
    1961
  • Firstpage
    272
  • Lastpage
    278
  • Abstract
    The operation of missile flight-test instrumentation systems at minimum bandwidth is an important economic consideration. Design of instrumentation systems may become difficult or impossible unless intelligently chosen bandwidth parameters are specified. Since nearly all missile flight-test instrumentation systems operate as sampled data devices, the bandwidth parameter shows up as a sampling rate requirement. It can be shown, under fairly general conditions involving no highly restrictive assumptions, that the rate of information acquisition of a sampled-data instrumentation system, when considered as a function of sampling interval, has a maximum. This can be readily appreciated intuitively. For a position-measurement system, for instance, if the sampling interval is made very short, the amount of information gained with each subsequent sample is very small because of the large amount of prior information about the position of the object being measured. No information would be gained if a sample were taken an infinitesimally small time after an initial measurement. Also, a very long time interval between samples would permit considerable growth of ignorance about the object´s position, but the logarithmic information-gain function would grow slowly compared with t-1; so the information rate for long sampling intervals would also be a small number. Somewhere between these two cases lies at least one maximum in information rate. The selection of a sampling rate corresponding to the maximum information rate is recommended as a good choice for many types of missile test instrumentation systems.
  • Keywords
    Bandwidth; Costs; Information rates; Instruments; Missiles; Production; Prototypes; Radio frequency; Sampling methods; System testing;
  • fLanguage
    English
  • Journal_Title
    Military Electronics, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-2511
  • Type

    jour

  • DOI
    10.1109/IRET-MIL.1961.5008367
  • Filename
    5008367