DocumentCode :
953758
Title :
High-level synthesis of data paths for easy testability
Author :
Dhodhi, M.K. ; Ahmad, I. ; Ismaeel, A.A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Kuwait Univ., Safat, Kuwait
Volume :
142
Issue :
4
fYear :
1995
fDate :
8/1/1995 12:00:00 AM
Firstpage :
209
Lastpage :
216
Abstract :
The paper presents a method for high-level synthesis of easy testable data paths from a given behavioural description of a design. The synthesis process uses an approach based on a problem-space genetic algorithm (PSGA) to perform integrated scheduling, allocation of testable functional units and registers under area, delay and testability constraints. Testability at behavioural level can be enhanced by minimising the number of self-adjacent registers (self-loops). The main objective is to minimise the testability overhead (area and delay) while searching the design-space to provide a self-loop free architecture. Experiments on benchmarks show that self-loops can be eliminated with minimum additional hardware resources
Keywords :
ULSI; VLSI; built-in self test; data flow graphs; design for testability; genetic algorithms; high level synthesis; logic testing; ULSI; VLSI; behavioural description; behavioural level testability; benchmarks; data paths; delay constraints; easy testability; high-level synthesis; integrated scheduling; intelligent design space exploration; problem-space genetic algorithm; registers under area; self-adjacent registers; self-loops; testability constraints; testability overhead minimisation; testable functional units;
fLanguage :
English
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings -
Publisher :
iet
ISSN :
1350-2409
Type :
jour
DOI :
10.1049/ip-cds:19952011
Filename :
465179
Link To Document :
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