DocumentCode
953865
Title
Three-dimensional defect localization from time-of-flight/eddy current testing data
Author
Tamburrino, A. ; Fresa, R. ; Udpa, S.S. ; Tian, Y.
Author_Institution
Dipt. di Automazione, Univ. di Cassino, Italy
Volume
40
Issue
2
fYear
2004
fDate
3/1/2004 12:00:00 AM
Firstpage
1148
Lastpage
1151
Abstract
This paper deals with the inverse problem of defect detection in a conductive material using eddy current nondestructive evaluation (NDE) methods. We consider a full three-dimensional time-domain problem in the quasistatic regime. The inversion method exploits the properties of the Q-transform, an integral operator capable of mapping wave propagation fields into diffusive fields. This one-to-one operator allows one to define the concept of time-of-flight (TOF) for diffusive fields. Specifically, we show that by properly choosing the waveform of the driving current, the distance between probe and defect can be easily extracted from eddy current measurements, as in TOF measurements employed in wave propagation NDE methods.
Keywords
conducting materials; delay estimation; eddy current testing; electromagnetic wave propagation; inverse problems; Q-transform; conducting materials; defect detection; defect localization; delay estimation; diffusive fields; eddy current measurements; eddy current testing; electromagnetic tomography; inverse problem; inversion method; nondestructive evaluation methods; nondestructive testing; quasistatic regime; time-domain problem; time-of-flight measurements; wave propagation; Conducting materials; Current measurement; Data mining; Eddy current testing; Eddy currents; Electromagnetic measurements; Inverse problems; Magnetic materials; Nondestructive testing; Time domain analysis;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2004.824584
Filename
1284621
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