DocumentCode :
953865
Title :
Three-dimensional defect localization from time-of-flight/eddy current testing data
Author :
Tamburrino, A. ; Fresa, R. ; Udpa, S.S. ; Tian, Y.
Author_Institution :
Dipt. di Automazione, Univ. di Cassino, Italy
Volume :
40
Issue :
2
fYear :
2004
fDate :
3/1/2004 12:00:00 AM
Firstpage :
1148
Lastpage :
1151
Abstract :
This paper deals with the inverse problem of defect detection in a conductive material using eddy current nondestructive evaluation (NDE) methods. We consider a full three-dimensional time-domain problem in the quasistatic regime. The inversion method exploits the properties of the Q-transform, an integral operator capable of mapping wave propagation fields into diffusive fields. This one-to-one operator allows one to define the concept of time-of-flight (TOF) for diffusive fields. Specifically, we show that by properly choosing the waveform of the driving current, the distance between probe and defect can be easily extracted from eddy current measurements, as in TOF measurements employed in wave propagation NDE methods.
Keywords :
conducting materials; delay estimation; eddy current testing; electromagnetic wave propagation; inverse problems; Q-transform; conducting materials; defect detection; defect localization; delay estimation; diffusive fields; eddy current measurements; eddy current testing; electromagnetic tomography; inverse problem; inversion method; nondestructive evaluation methods; nondestructive testing; quasistatic regime; time-domain problem; time-of-flight measurements; wave propagation; Conducting materials; Current measurement; Data mining; Eddy current testing; Eddy currents; Electromagnetic measurements; Inverse problems; Magnetic materials; Nondestructive testing; Time domain analysis;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2004.824584
Filename :
1284621
Link To Document :
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