• DocumentCode
    953965
  • Title

    A case study of C.mmp, Cm*, and C.vmp: Part II—Predicting and calibrating reliability of multiprocessor systems

  • Author

    Siewiorek, Daniel P. ; Kini, Vittal ; Joobbani, Rostam ; Bellis, Harold

  • Author_Institution
    Carnegie-Mellon University, Pittsburgh, PA
  • Volume
    66
  • Issue
    10
  • fYear
    1978
  • Firstpage
    1200
  • Lastpage
    1220
  • Abstract
    This paper focuses on measurement and modeling of hard failures in multiprocessors. The failure rate predictions of the Military Standardization Handbook 217B (MIL 217B) are compared with semiconductor chip vendor data and data from Carnegie-Mellon University´s multiprocessor systems. Based on these comparisons a modified MIL 217B model is proposed. The modified model is employed to calculate module failure rates for the three multiprocessors designed, implemented, and currently operating at CMU. Hard failure reliability models for these three systems are presented. These models use the calculated module failure rates as a basis for a consistent comparison of the three systems.
  • Keywords
    Calibration; Condition monitoring; Conductors; Contracts; Engineering drawings; Military standards; Multiprocessing systems; Predictive models; Semiconductor device measurement; Standardization;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1978.11112
  • Filename
    1455381
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=953965