• DocumentCode
    953981
  • Title

    Influence of growth conditions on the threshold current density of double-heterostructure lasers prepared by molecular-beam epitaxy

  • Author

    Cho, Andrew Y. ; Casey, H.C. ; Radice, C. ; Foy, P.W.

  • Author_Institution
    Bell Laboratories, Murray Hill, USA
  • Volume
    16
  • Issue
    2
  • fYear
    1980
  • Firstpage
    72
  • Lastpage
    74
  • Abstract
    The effect on threshold current density Jth of the use of an air-lock sample-exchange mechanism, substrate preparation and Al source purity was investigated for GaAs-Al0.27 Ga0.73 As double-heterostructure lasers grown by molecular-beam epitaxy (m.b.e.). The conditions necessary to prepare m.b.e. wafers that give Jth as low as for wafers prepared by liquid-phase epitaxy (Jth ¿ 1 × 103 A/cm2 for an active layer thickness of 0.1 ¿m) are summarised.
  • Keywords
    III-V semiconductors; gallium arsenide; molecular beam epitaxial growth; semiconductor epitaxial layers; semiconductor growth; semiconductor junction lasers; GaAs-Al0.27Ga0.73As; MBE; air lock sample exchange mechanism; double heterostructure lasers; molecular beam epitaxy; threshold current density;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19800053
  • Filename
    4243842