DocumentCode
954096
Title
Three-dimensional Gaussian beam reflection from short-circuited isotropic ferrite slab
Author
Luk, K.M. ; Cullen, A.L.
Author_Institution
Dept of Electron. Eng., City Polytech. of Hong Kong, Kowloon, Hong Kong
Volume
41
Issue
7
fYear
1993
fDate
7/1/1993 12:00:00 AM
Firstpage
962
Lastpage
966
Abstract
The plane wave spectrum analysis is extended to the study of three-dimensional Gaussian beam propagation and scattering. The reflection of a three-dimensional circular Gaussian beam from a parallel-sided ferrite slab, backed by a ground plane, is then investigated. The beam field is represented by an angular continuous spectrum of plane waves. Using the Fresnel reflection coefficients of the short-circuited slab for both perpendicular and parallel polarizations, a paraxial approximation for the reflected beam field is derived. It is found that after reflection from the short-circuited slab, the circular Gaussian beam becomes, in general, an elliptical Gaussian beam, and the beam axis is displaced from the position predicted by ray optics. For the thin slab case, approximate formulas for the phase center difference and the lateral shift are determined. The relevance of these results to a new method of ferrite measurement is explained
Keywords
electromagnetic wave propagation; electromagnetic wave reflection; electromagnetic wave scattering; ferrites; microwave measurement; spectral analysis; 3D Gaussian beam; Fresnel reflection coefficients; Gaussian beam propagation; Gaussian beam reflection; Gaussian beam scattering; MM wave; circular Gaussian beam; elliptical Gaussian beam; ferrite measurement; lateral shift; parallel polarizations; parallel-sided ferrite slab; paraxial approximation; perpendicular polarisation; phase center difference; plane wave spectrum analysis; reflected beam field; short-circuited isotropic ferrite slab; Dielectrics; Electromagnetic scattering; Ferrites; Fresnel reflection; Magnetic materials; Millimeter wave measurements; Optical reflection; Optical scattering; Slabs; Wavelength measurement;
fLanguage
English
Journal_Title
Antennas and Propagation, IEEE Transactions on
Publisher
ieee
ISSN
0018-926X
Type
jour
DOI
10.1109/8.237629
Filename
237629
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