DocumentCode :
954221
Title :
Effects of head shape on EEGs and MEGs
Author :
Cuffin, B.Neil
Author_Institution :
Francis Bitter Nat. Magnet Lab., MIT, Cambridge, MA, USA
Volume :
37
Issue :
1
fYear :
1990
Firstpage :
44
Lastpage :
52
Abstract :
Results are presented of computer modeling studies of the effects of head shape on electroencephalograms (EEGs) and magnetoencephalograms (MEGs) and on the localization of electrical sources in the brain using these measurements. The effects of general, nonspherical head shape are determined by comparisons of EEG and MEG maps from nonspherical head models with corresponding maps from a spherical head model. The effects on source localization accuracy are determined by calculating moving dipole inverse solutions in a spherical head model using EEGs and MEGs from the nonspherical models and comparing the solutions with those for known sources. It was found that nonspherical head shape can produce significant changes in the maps produced by some sources in the cortical region of the brain but produce localization errors of less than approximately 1 cm. No significant differences in the effects of such deviations on EEGs and MEGs were found.
Keywords :
bioelectric phenomena; biomagnetism; digital simulation; electroencephalography; medical computing; physiological models; 1 cm; EEG maps; MEG maps; brain cortical region; brain electrical sources localisation; computer modeling studies; cortical region; electroencephalograms; head shape; localization errors; magnetoencephalograms; moving dipole inverse solutions; nonspherical head models; nonspherical head shape; source localization accuracy; spherical head model; Brain modeling; Computer errors; Conductivity; Electric variables measurement; Electroencephalography; Magnetic fields; Magnetic heads; Scalp; Shape measurement; Skull; Brain Mapping; Computer Simulation; Electric Conductivity; Electroencephalography; Electromagnetic Fields; Head; Magnetoencephalography; Models, Neurological;
fLanguage :
English
Journal_Title :
Biomedical Engineering, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9294
Type :
jour
DOI :
10.1109/10.43614
Filename :
43614
Link To Document :
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