DocumentCode :
954376
Title :
Noise measurements on proximity effect bridges
Author :
Decker, S.K. ; Mercereau, J.E.
Author_Institution :
IEEE TMAG
Volume :
11
Issue :
2
fYear :
1975
fDate :
3/1/1975 12:00:00 AM
Firstpage :
848
Lastpage :
851
Abstract :
Audio frequency noise density measurements have been performed on weakly superconducting proximity effect bridges using a cooled transformer and room temperature low noise preamplifier. The noise temperature of the measuring system is approximately 4°K for a 0.9Ω resistor. Noise density was measured as a function of bias current and temperature for the bridges. Excess noise above that expected from Johnson noise for a resistor equal to the dynamic resistance of the bridges, was observed in the region near the critical current of the device. At high currents, compared to the critical current, the noise density closely approaches that given by Johnson noise.
Keywords :
Josephson device noise; Bridges; Critical current; Density measurement; Electrical resistance measurement; Frequency; Noise measurement; Proximity effect; Resistors; Superconducting device noise; Temperature;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1975.1058632
Filename :
1058632
Link To Document :
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