DocumentCode
954465
Title
2.0 ¿m c.w. operation of GaInAsSb/GaSb d.h. lasers at 80 K
Author
Kano, Hiroyuki ; Sugiyama, Koichi
Author_Institution
NTT, Musashino Electrical Communication Laboratory, Musashino, Japan
Volume
16
Issue
4
fYear
1980
Firstpage
146
Lastpage
147
Abstract
GaInAsSb/GaSb double-heterostructure (d.h.) lasers were fabricated by liquid-phase-epitaxial growth. C.W. operation was realised at 80 K with a wavelength of 2.0 ¿m. From measurement of laser thresholds as a function of temperature, it was shown that threshold currents for pulsed operation are described by the expression I(T) ¿ exp (T/T0), where T0 = 58 K.
Keywords
III-V semiconductors; gallium compounds; liquid phase epitaxial growth; semiconductor junction lasers; 2 micron wavelength; 80K operation; CW operation; GaInAsSb/GaSb DH lasers; LPE fabricated lasers; fabrication; pulsed operation; semiconductor lasers; threshold currents;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19800107
Filename
4243902
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