DocumentCode
954796
Title
Application of integrated circuit technology to the fabrication of large numbers of niobium based Josephson junctions
Author
Owen, Scott ; Nordman, James E.
Author_Institution
IEEE TMAG
Volume
11
Issue
2
fYear
1975
fDate
3/1/1975 12:00:00 AM
Firstpage
774
Lastpage
777
Abstract
A batch fabrication technology is described for the production of small niobium based Josephson junctions. This technology uses thermally oxidized silicon wafers as substrates, allowing maximum usage of silicon integrated circuit techniques and equipment. Patterns are produced in rf sputtered niobium films by sputter etching through masks generated by "step and repeat" photolithographic techniques. Typically over 600 junctions are fabricated at one time. Measurements of voltampere curves, Josephson current versus magnetic field, and self resonant step structure were made.
Keywords
Josephson devices; Current measurement; Fabrication; Integrated circuit technology; Josephson junctions; Magnetic field measurement; Magnetic films; Niobium; Production; Silicon; Sputter etching;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1975.1058676
Filename
1058676
Link To Document