• DocumentCode
    954796
  • Title

    Application of integrated circuit technology to the fabrication of large numbers of niobium based Josephson junctions

  • Author

    Owen, Scott ; Nordman, James E.

  • Author_Institution
    IEEE TMAG
  • Volume
    11
  • Issue
    2
  • fYear
    1975
  • fDate
    3/1/1975 12:00:00 AM
  • Firstpage
    774
  • Lastpage
    777
  • Abstract
    A batch fabrication technology is described for the production of small niobium based Josephson junctions. This technology uses thermally oxidized silicon wafers as substrates, allowing maximum usage of silicon integrated circuit techniques and equipment. Patterns are produced in rf sputtered niobium films by sputter etching through masks generated by "step and repeat" photolithographic techniques. Typically over 600 junctions are fabricated at one time. Measurements of voltampere curves, Josephson current versus magnetic field, and self resonant step structure were made.
  • Keywords
    Josephson devices; Current measurement; Fabrication; Integrated circuit technology; Josephson junctions; Magnetic field measurement; Magnetic films; Niobium; Production; Silicon; Sputter etching;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1975.1058676
  • Filename
    1058676