• DocumentCode
    954799
  • Title

    Design of pseudoexhaustive testable PLA with low overhead

  • Author

    Shen, Wen-Zen ; Hwang, Gwo-Haur ; Hsu, Wen-Jun ; Jan, Yun-Jung

  • Author_Institution
    Inst. of Electron., Nat. Chiao Tung Univ., Hsin-Chu, Taiwan
  • Volume
    42
  • Issue
    7
  • fYear
    1993
  • fDate
    7/1/1993 12:00:00 AM
  • Firstpage
    887
  • Lastpage
    891
  • Abstract
    The pseudoexhaustive testing (PET) scheme is an economical approach to testing a large embedded programmable logic array (PLA). The authors propose an efficient algorithm named low overhead PET (LOPET) to partition the product lines. By applying this algorithm, both the area overhead and test length are reduced significantly
  • Keywords
    built-in self test; design for testability; logic arrays; logic testing; area overhead; large embedded programmable logic array; low overhead PET; product lines; pseudoexhaustive testable PLA; test length; Built-in self-test; Circuit testing; Logic design; Logic testing; Partitioning algorithms; Positron emission tomography; Programmable logic arrays; Shift registers; Test pattern generators; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.237730
  • Filename
    237730
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=954799