Title :
Design of pseudoexhaustive testable PLA with low overhead
Author :
Shen, Wen-Zen ; Hwang, Gwo-Haur ; Hsu, Wen-Jun ; Jan, Yun-Jung
Author_Institution :
Inst. of Electron., Nat. Chiao Tung Univ., Hsin-Chu, Taiwan
fDate :
7/1/1993 12:00:00 AM
Abstract :
The pseudoexhaustive testing (PET) scheme is an economical approach to testing a large embedded programmable logic array (PLA). The authors propose an efficient algorithm named low overhead PET (LOPET) to partition the product lines. By applying this algorithm, both the area overhead and test length are reduced significantly
Keywords :
built-in self test; design for testability; logic arrays; logic testing; area overhead; large embedded programmable logic array; low overhead PET; product lines; pseudoexhaustive testable PLA; test length; Built-in self-test; Circuit testing; Logic design; Logic testing; Partitioning algorithms; Positron emission tomography; Programmable logic arrays; Shift registers; Test pattern generators; Very large scale integration;
Journal_Title :
Computers, IEEE Transactions on
