Title :
Characteristics of in-line Josephson tunneling gates
Author :
Basavaiah, S. ; Broom, R.F.
Author_Institution :
IBM Thomas J. Watson Research Center, Yorktown Heights, New York
fDate :
3/1/1975 12:00:00 AM
Abstract :
Characteristics of in-line Josephson gates have been computed, using numerical techniques, for a number of differing junction length to Josephson penetration depth ratios. These are verified by systematic experimental results, where the agreement between theory and experiment was found to be good.
Keywords :
Josephson device logic gates; Current density; Equations; Helium; Josephson effect; Josephson junctions; Magnetic fields; Superconducting films; Superconducting logic circuits; Tunneling; Voltage control;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1975.1058677
