Title :
Complex electrical thermal and radiation aging of dielectric films
Author :
Laghari, Javaid R.
Author_Institution :
Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
fDate :
10/1/1993 12:00:00 AM
Abstract :
The effects of electrical, thermal and radiation stresses, singularly or simultaneously, on dielectric films are reviewed. The types of accelerated aging under these stresses and the statistical methods used to evaluate the experimental data for life, including the two-parameter Weibull and the log-normal distributions, are described briefly. The experimental life models currently used for aging are discussed. Recent data on the complex electrical/thermal/radiation aging of dielectric films are described
Keywords :
ageing; dielectric thin films; electric breakdown of solids; insulation testing; life testing; organic insulating materials; polymer films; radiation effects; reviews; statistical analysis; thermal stresses; PET; PTFE; accelerated ageing test; breakdown voltage; dielectric films; electrical ageing; log-normal distributions; polymeric insulators; polystyrene; radiation aging; statistical methods; thermal ageing; thermal stress; two-parameter Weibull distribution; Accelerated aging; Dielectric films; Dielectrics and electrical insulation; Electric breakdown; Inverse problems; Performance evaluation; Testing; Thermal degradation; Thermal stresses; Voltage;
Journal_Title :
Electrical Insulation, IEEE Transactions on
