Complex electrical thermal and radiation aging of dielectric films

Author

Laghari, Javaid R.

Author_Institution

Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA

Volume

28

Issue

5

fYear

1993

fDate

10/1/1993 12:00:00 AM

Firstpage

777

Lastpage

788

Abstract

The effects of electrical, thermal and radiation stresses, singularly or simultaneously, on dielectric films are reviewed. The types of accelerated aging under these stresses and the statistical methods used to evaluate the experimental data for life, including the two-parameter Weibull and the log-normal distributions, are described briefly. The experimental life models currently used for aging are discussed. Recent data on the complex electrical/thermal/radiation aging of dielectric films are described

Keywords

ageing; dielectric thin films; electric breakdown of solids; insulation testing; life testing; organic insulating materials; polymer films; radiation effects; reviews; statistical analysis; thermal stresses; PET; PTFE; accelerated ageing test; breakdown voltage; dielectric films; electrical ageing; log-normal distributions; polymeric insulators; polystyrene; radiation aging; statistical methods; thermal ageing; thermal stress; two-parameter Weibull distribution; Accelerated aging; Dielectric films; Dielectrics and electrical insulation; Electric breakdown; Inverse problems; Performance evaluation; Testing; Thermal degradation; Thermal stresses; Voltage;

fLanguage

English

Journal_Title

Electrical Insulation, IEEE Transactions on

Publisher

ieee

ISSN

0018-9367

Type

jour

DOI

10.1109/14.237741

Filename

237741