• DocumentCode
    954966
  • Title

    The contact resistance force relationship of an intrinsically conducting polymer interface

  • Author

    Lam, Yu-Zhi ; Swingler, Jonathan ; McBride, John W.

  • Author_Institution
    Sch. of Eng. Sci., Univ. of Southampton
  • Volume
    29
  • Issue
    2
  • fYear
    2006
  • fDate
    6/1/2006 12:00:00 AM
  • Firstpage
    294
  • Lastpage
    302
  • Abstract
    Investigations on contact connector materials for different applications such as in the automotive industry have focused toward the increasing interest of using conducting polymers, as compared to conventional metallic contacts. The aim is to achieve overall improvements in performance as well as cost effectiveness. Currently, extrinsic conducting polymers (ECPs) are employed as conductive coats or adhesives at contact interfaces. However, frictional abrasion within the metal doped polymer (ECP) causes fretting corrosion, which leads to instability in the contact resistance. To overcome this, intrinsically conducting polymers (ICPs) are explored. Hemispherical contact coatings were fabricated using poly(3,4-ethylenedioxythiopene) (PEDOT) or polyaniline/polyvinylchloride (PANI/PVC) commodity blends. Contact resistances were taken using four-wire resistance measurement techniques. The conductivities of in-house fabricated ICP contacts were found to be in the range of 10-2 Smiddotcm-1. The response relating the change of contact resistance under varying compression force appeared to be repeatable with minimum deviation of 2%. The surface profiles of the ICP contacts were also recorded by an optical confocal system. The initial investigation results presented in this paper were used to evaluate and validate the hypothesis of employing ICP contacts to eliminate or minimize wearing and fretting effects
  • Keywords
    adhesives; conducting polymers; contact resistance; electric connectors; electric resistance measurement; PANI-PVC; PEDOT; Polyaniline-polyvinylchloride; compression force; conducting polymer interface; contact connector materials; contact interfaces; contact resistance; extrinsic conducting polymers; four-wire resistance measurement; fretting corrosion; frictional abrasion; hemispherical contact coatings; intrinsically conducting polymers; metal doped polymer; optical confocal system; poly(3,4-ethylenedioxythiopene); surface profile; wearing effects; Automotive engineering; Conducting materials; Connectors; Contact resistance; Costs; Industrial relations; Inorganic materials; Metals industry; Plastics industry; Polymers; Contact connector; contact resistance; fretting; intrinsically conducting polymer (ICP); surface profile;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2006.875903
  • Filename
    1637762