DocumentCode :
955288
Title :
Alternative Methods for Determining Chip Inductor Parameters
Author :
Manka, W.
Author_Institution :
American Precision Industries,Inc.,East Aurora, NY
Volume :
13
Issue :
4
fYear :
1977
fDate :
12/1/1977 12:00:00 AM
Firstpage :
378
Lastpage :
385
Abstract :
For high density packaging applications, it is not sufficient to know only the inductance, Q, and dc resistance of a chip inductor. The self-resonant frequency, coupling coefficient, working voltage, and rated current are important parameters that must also be known to properly utilize these components. However, the small size and shielding of chip inductors make it difficult to determine these parameters by conventional means. This paper suggests possible alternative methods. The advantages; disadvantages, and precautions of the conventional and alternative methods for determining the self-resonant frequency, coupling coefficient, working voltage, and rated current are discussed and compared. It is intended that this paper will prove to be useful source of practical information to engineers, enabling them to utilize chip inductors and other magnetic components more effectively.
Keywords :
Electrical variables measurement; Inductors; Circuit testing; Electrical resistance measurement; Fixtures; Frequency; Inductance; Inductors; Instruments; Packaging; Semiconductor device measurement; Voltage;
fLanguage :
English
Journal_Title :
Parts, Hybrids, and Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
0361-1000
Type :
jour
DOI :
10.1109/TPHP.1977.1135217
Filename :
1135217
Link To Document :
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