DocumentCode
955834
Title
Quantum-well p-channel AlGaAs/InGaAs/GaAs heterostructure insulated-gate field-effect transistors
Author
Ruden, P.Paul ; Shur, Micheel ; Arch, David K. ; Daniels, R.R. ; Grider, David E. ; Nohava, Thomas E.
Author_Institution
Honeywell Inc., Bloomington, MN, USA
Volume
36
Issue
11
fYear
1989
fDate
11/1/1989 12:00:00 AM
Firstpage
2371
Lastpage
2379
Abstract
The authors report experimental and theoretical results for self-aligned gate quantum-well p-channel pseudomorphic GaAs/InGaAs/AlGaAs heterostructure insulated-gate field-effect transistors (HIGFETs). High transconductances and transconductance parameters, 113 mS/mm and 305 mS/mm/V at room temperature for 0.8- mu m gate length, are reported. The authors discuss the effects of built-in strain on the valence bands, analyze the device data on the gate length dependence of the device parameters, and discuss the subthreshold characteristics and evidence for implant straggle. They also show the importance of the gate current for the device characteristics and propose to reduce the gate current and thus to increase the voltage swing by fabricating p-channel devices with p-doped InGaAs channels and n+ AlGaAs gates on the insulating AlGaAs layer.
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; indium compounds; insulated gate field effect transistors; semiconductor quantum wells; 0.8 micron; 113 mS; AlGaAs-InGaAs-GaAs; built-in strain; gate current; gate length; heterostructure insulated-gate field-effect transistors; implant straggle; quantum well p-channel HIGFET; subthreshold characteristics; transconductance; valence bands; voltage swing; Capacitive sensors; Data analysis; FETs; Gallium arsenide; Implants; Indium gallium arsenide; Insulation; Quantum wells; Temperature; Transconductance;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.43656
Filename
43656
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