DocumentCode
955854
Title
Reliability Evaluation and Failure Analysis for Multilayer Ceramic Chip Capacitors
Author
Kobayashi, Toshio ; Ariyoshi, Hisashi ; Masuda, Akihiko
Author_Institution
NTT public Corp.,Tokyo, Japan
Volume
1
Issue
3
fYear
1978
fDate
9/1/1978 12:00:00 AM
Firstpage
316
Lastpage
324
Abstract
Reliability evaluation tests for multilayer ceramic chip capacitors mounted on a hybrid IC were implemented. Failure modes, failure mechanisms, and drift of characteristics were analyzed. Humidity acceleration as well as voltage and temperature accelerations were investigated to estimate the chip capacitor reliability. The chip capacitor reliability proved to be high and adequate for the service period of the communication system.
Keywords
Ceramic capacitors; Component reliability; Failure analysis; Reliability testing; Acceleration; Capacitors; Ceramics; Failure analysis; Humidity; Hybrid integrated circuits; Integrated circuit testing; Nonhomogeneous media; Temperature; Voltage;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1978.1135275
Filename
1135275
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