DocumentCode :
955977
Title :
Foreword
Author :
Porter, W.
Author_Institution :
A&M university, Texas
Volume :
1
Issue :
3
fYear :
1978
fDate :
9/1/1978 12:00:00 AM
Firstpage :
202
Lastpage :
202
Keywords :
Electrical engineering; Instruments; Manufacturing; Nondestructive testing; Physics; Research and development; Solid state circuits; Very large scale integration; Wire;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1978.1135289
Filename :
1135289
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=955977
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