DocumentCode
956024
Title
Ion Microprobe Analysis of Cathode Nickel Alloys
Author
Wachi, F.M. ; Marquez, N. ; Shepherd, J.R.
Author_Institution
Aerospace Corp.
Volume
1
Issue
4
fYear
1978
fDate
12/1/1978 12:00:00 AM
Firstpage
400
Lastpage
404
Abstract
An ion-microprobe technique of analysis for manganese and other potentially detrimental impurities in machined cathode nickel alloy buttons is described. This nondestructive method does not jeopardize the subsequent performance characteristics of the nickel ahoy button as a substrate for the barium-strontium oxide emitter material. This analytical technique is currently used as a standard quality assurance/quality control procedure in the fabrication of cathode assemblies of traveling-wave tubes for space applications.
Keywords
Chemistry; Ion-beam applications; Nickel alloys/compounds; Traveling-wave; Aerospace materials; Assembly; Cathodes; Electron emission; Fabrication; Impurities; Manganese; Nickel alloys; Quality assurance; Space exploration;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1978.1135294
Filename
1135294
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