• DocumentCode
    956095
  • Title

    Five-Year Life Test Data on Pressure (10 000 lbf/in2) Tolerant Electronic Components

  • Author

    Marquardt, Robert A.

  • Author_Institution
    General Elec. Co.
  • Volume
    1
  • Issue
    4
  • fYear
    1978
  • fDate
    12/1/1978 12:00:00 AM
  • Firstpage
    365
  • Lastpage
    371
  • Abstract
    A program is described where long-term reliability data on contemporary electronic components under a fluid pressure environment were accumulated. Resistors, capacitors, diodes, integrated circuits, inductors, and preamplifier modules that showed excellent short-term immunity to pressure were pressure-cycled five times and stored in silicone oil at 10 000 lbf/in2 (deep ocean pressure) for five years. The test results of these six classes of components (750 individual components) indicate that the high-pressure oil is not a harsh environment if the components and oil are properly selected and screened.
  • Keywords
    Component reliability; Environmental factors; Life testing; Capacitors; Circuit testing; Diodes; Electronic components; Inductors; Integrated circuit reliability; Life testing; Petroleum; Preamplifiers; Resistors;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1978.1135301
  • Filename
    1135301