DocumentCode :
956095
Title :
Five-Year Life Test Data on Pressure (10 000 lbf/in2) Tolerant Electronic Components
Author :
Marquardt, Robert A.
Author_Institution :
General Elec. Co.
Volume :
1
Issue :
4
fYear :
1978
fDate :
12/1/1978 12:00:00 AM
Firstpage :
365
Lastpage :
371
Abstract :
A program is described where long-term reliability data on contemporary electronic components under a fluid pressure environment were accumulated. Resistors, capacitors, diodes, integrated circuits, inductors, and preamplifier modules that showed excellent short-term immunity to pressure were pressure-cycled five times and stored in silicone oil at 10 000 lbf/in2 (deep ocean pressure) for five years. The test results of these six classes of components (750 individual components) indicate that the high-pressure oil is not a harsh environment if the components and oil are properly selected and screened.
Keywords :
Component reliability; Environmental factors; Life testing; Capacitors; Circuit testing; Diodes; Electronic components; Inductors; Integrated circuit reliability; Life testing; Petroleum; Preamplifiers; Resistors;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1978.1135301
Filename :
1135301
Link To Document :
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