• DocumentCode
    956108
  • Title

    Theoretical and practical aspects of three-terminal silicon heterostructure switches

  • Author

    Chol, Ajuoi M. ; Green, Roger J.

  • Author_Institution
    Dept. of Electr. Eng., Bradford Univ., UK
  • Volume
    36
  • Issue
    11
  • fYear
    1989
  • fDate
    11/1/1989 12:00:00 AM
  • Firstpage
    2481
  • Lastpage
    2491
  • Abstract
    The electrical switching characteristics of three-terminal silicon heterostructure switches in the presence and absence of DC base excitation are reported. A comparison of base-current dependence characteristics for two switches with different epilayer doping concentrations and epilayer layer thickness is also presented. Device switching and holding voltages and currents are found to be dependent on epilayer thickness and doping concentration. A qualitative comparison of theoretically calculated and experimentally measured current-voltage characteristics is made. Good correlation between the calculated and measured switching and holding voltages and currents is obtained for grounded emitter and grounded collector carrier injection.
  • Keywords
    elemental semiconductors; semiconductor device testing; semiconductor switches; silicon; DC base excitation; MPSS switch; Si three terminal heterostructure switches; base-current dependence characteristics; current-voltage characteristics; electrical switching characteristics; epilayer doping concentrations; epilayer thickness; grounded collector carrier injection; grounded emitter carrier injection; holding voltages; switching voltage; Conductivity; Current measurement; Current-voltage characteristics; Doping; Electrons; Feedback loop; P-n junctions; Silicon; Spontaneous emission; Switches; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.43671
  • Filename
    43671