DocumentCode
956108
Title
Theoretical and practical aspects of three-terminal silicon heterostructure switches
Author
Chol, Ajuoi M. ; Green, Roger J.
Author_Institution
Dept. of Electr. Eng., Bradford Univ., UK
Volume
36
Issue
11
fYear
1989
fDate
11/1/1989 12:00:00 AM
Firstpage
2481
Lastpage
2491
Abstract
The electrical switching characteristics of three-terminal silicon heterostructure switches in the presence and absence of DC base excitation are reported. A comparison of base-current dependence characteristics for two switches with different epilayer doping concentrations and epilayer layer thickness is also presented. Device switching and holding voltages and currents are found to be dependent on epilayer thickness and doping concentration. A qualitative comparison of theoretically calculated and experimentally measured current-voltage characteristics is made. Good correlation between the calculated and measured switching and holding voltages and currents is obtained for grounded emitter and grounded collector carrier injection.
Keywords
elemental semiconductors; semiconductor device testing; semiconductor switches; silicon; DC base excitation; MPSS switch; Si three terminal heterostructure switches; base-current dependence characteristics; current-voltage characteristics; electrical switching characteristics; epilayer doping concentrations; epilayer thickness; grounded collector carrier injection; grounded emitter carrier injection; holding voltages; switching voltage; Conductivity; Current measurement; Current-voltage characteristics; Doping; Electrons; Feedback loop; P-n junctions; Silicon; Spontaneous emission; Switches; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.43671
Filename
43671
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