DocumentCode :
956116
Title :
Improved optical interference technique for the measurements of refractive index and thickness of submicron bubble films
Author :
Nakagawa, T. ; Kono, N. ; Asama, K.
Author_Institution :
Fujitsu Laboratories Ltd., Kawasaki, Japan
Volume :
11
Issue :
5
fYear :
1975
fDate :
9/1/1975 12:00:00 AM
Firstpage :
1397
Lastpage :
1399
Abstract :
A method of measuring the refractive index and thickness of garnet films by the combined use of the variable wavelength method and the variable angle monochromatic fringe observation method has been developed. This technique can be used to determine film thicknesses from 0.5 μm to several microns with an accuracy of 1%. A rapid and accurate evaluation technique for the measurement of the bubble collapse field is described. Stable submicron bubbles can be found in the Systems, (YCaSm)3- (GeFe)5O12, (YCaEuTm)3(GeFe)5O12and (YLaTm)3(GaFe)5O12. Bubble velocities for these films were measured by the bubble transport method. At a driving field of 2.5 Oe across the bubble, velocities ranging from 300 te 1050 Cm/sec have been observed.
Keywords :
Magnetic bubble domains; Magnetic bubble films; Optical measurements; Optical refraction; Thickness measurement; Garnet films; Interference; Optical films; Optical refraction; Optical variables control; Refractive index; Tellurium; Thickness measurement; Velocity measurement; Wavelength measurement;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1975.1058811
Filename :
1058811
Link To Document :
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