DocumentCode :
956136
Title :
The modulated-gate FET-a novel MOSFET structure exhibiting controlled negative resistance
Author :
Gill, B.S. ; Heasell, E.L.
Author_Institution :
Dept. of Electr. Eng., Waterloo Univ., Ont., Canada
Volume :
36
Issue :
11
fYear :
1989
fDate :
11/1/1989 12:00:00 AM
Firstpage :
2506
Lastpage :
2512
Abstract :
In a study of MOSFET structures that have a resistive gate, devices were fabricated using undoped polysilicon as the gate electrode. When the distribution of the channel charge was varied by changing the drain voltage, the induced gate charge varied. It was found that, in these structures the induced gate charge makes a major contribution to the local conductivity of the gate. The local value of gate resistance is modulated by changes of channel charge. if a current flows in the gate, then the gate potential distribution is changed when VDS is varied. Under suitable operating conditions an increase in drain voltage can lead to a decreasing or vanishing drain current.
Keywords :
insulated gate field effect transistors; negative resistance; MOSFET structures; channel charge distribution; controlled negative resistance; drain current; drain voltage; gate electrode; gate potential distribution; gate resistance; induced gate charge; local conductivity; modulated-gate FET; undoped polysilicon; Conductivity; Doping; Electrodes; Equations; FETs; Geometry; MOSFET circuits; Magnetic devices; Magnetic sensors; Sensor phenomena and characterization; Testing; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.43674
Filename :
43674
Link To Document :
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