DocumentCode
956148
Title
Unified nonquasi-static modeling of the long-channel four-terminal MOSFET for large- and small-signal analyses
Author
Chai, Kam-Wing ; Paulos, John J.
Author_Institution
Dept. of Electr. & Electron. Eng., Wales Univ., Swansea, UK
Volume
36
Issue
11
fYear
1989
fDate
11/1/1989 12:00:00 AM
Firstpage
2513
Lastpage
2520
Abstract
An iterative technique based on device transport and continuity equations is used to formulate a unified nonquasi-static model for the long-channel four-terminal MOSFET for both transient and small-signal analyses in all regions of operation (weak, moderate, and strong inversion). The model is physically derived without resorting to the concept of channel charge partitioning or the use of a priori assumptions about the functional form of the channel charge density. It is shown that the Ward charge-based model is only a 0th-order solution of this formulation. A first-order solution is presented that holds for arbitrary time-varying input voltages and can be reduced exactly to a small-signal nonquasi-static admittance model. Relaxation due to the channel resistance is included to account for the device nonquasi-static transient behavior. The first-order model consists of simple ordinary differential equations, which can be easily discretized for solution. Results from the proposed model are examined and compared with numerical simulation results and experimental data. Good agreement has been obtained.
Keywords
differential equations; insulated gate field effect transistors; iterative methods; semiconductor device models; Ward charge-based model; arbitrary time-varying input voltages; channel charge density; channel resistance; continuity equations; first-order model; iterative technique; large signal analysis; long-channel four-terminal MOSFET; moderate inversion; numerical simulation; ordinary differential equations; small-signal analyses; strong inversion; transient behavior; transport equations; unified nonquasistatic modelling; weak inversion; Admittance; Capacitance; Differential equations; Frequency; Integrated circuit modeling; MOS integrated circuits; MOSFET circuits; Numerical simulation; Transient analysis; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.43675
Filename
43675
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