DocumentCode
956150
Title
Reducing Post-Trim Drift of Thin-Film Resistors by Optimizing YAG Laser Output Characteristics
Author
Dow, Robert ; Mauck, Michael ; Richardson, Thomas ; Swenson, Edward
Author_Institution
Bell Labs.
Volume
1
Issue
4
fYear
1978
fDate
12/1/1978 12:00:00 AM
Firstpage
392
Lastpage
397
Abstract
A study to determine the effects of laser parameters on tantalum nitride resistor stability is presented. A model Of the laser heat affected zone is proposed which relates laser pulse width, power, wavelength, repetition rate, and waist size parameters to energy delivered to remaining resistor material. Samples of qualified tantalum nitride resistors are trimmed with a range of laser parameters, and the results are compared with the model. The excellent agreement between the model and experiment allows these results to be used for process control and throughput versus tolerance calculations.
Keywords
Laser applications, materials processing; Neodymium:YAG lasers; Thin-film resistors; Laser modes; Laser stability; Optical materials; Optical pulses; Power lasers; Process control; Resistors; Space vector pulse width modulation; Throughput; Transistors;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1978.1135306
Filename
1135306
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