• DocumentCode
    956150
  • Title

    Reducing Post-Trim Drift of Thin-Film Resistors by Optimizing YAG Laser Output Characteristics

  • Author

    Dow, Robert ; Mauck, Michael ; Richardson, Thomas ; Swenson, Edward

  • Author_Institution
    Bell Labs.
  • Volume
    1
  • Issue
    4
  • fYear
    1978
  • fDate
    12/1/1978 12:00:00 AM
  • Firstpage
    392
  • Lastpage
    397
  • Abstract
    A study to determine the effects of laser parameters on tantalum nitride resistor stability is presented. A model Of the laser heat affected zone is proposed which relates laser pulse width, power, wavelength, repetition rate, and waist size parameters to energy delivered to remaining resistor material. Samples of qualified tantalum nitride resistors are trimmed with a range of laser parameters, and the results are compared with the model. The excellent agreement between the model and experiment allows these results to be used for process control and throughput versus tolerance calculations.
  • Keywords
    Laser applications, materials processing; Neodymium:YAG lasers; Thin-film resistors; Laser modes; Laser stability; Optical materials; Optical pulses; Power lasers; Process control; Resistors; Space vector pulse width modulation; Throughput; Transistors;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1978.1135306
  • Filename
    1135306