• DocumentCode
    956199
  • Title

    Extreme Temperature Range Microelectronics

  • Author

    Palmer, David W. ; Heckman, Richard C.

  • Author_Institution
    Sandia Labs
  • Volume
    1
  • Issue
    4
  • fYear
    1978
  • fDate
    12/1/1978 12:00:00 AM
  • Firstpage
    333
  • Lastpage
    340
  • Abstract
    Down-hole geothermal instrumentation must operate over a large temperature range. The technology and capabilities of room temperature to 300°C hybrid and printed-circuit (PC) board electronics that were developed during the last two years to meet that need are summarized. To ensure rapid widespread commercialization, this technology was developed, insofar as possible, using commericaUy available components, devices, and materials. Initial extensive high-temperature characterization revealed that selected thickfilm passive components and silicon junction-field-effect transistors had electrical parameters sufficiently insensitive to temperature change and sufficiently constant in time at high temperatures to form the backbone of this circuitry. Attachment techniques needed to be developed, since standard methods failed at high temperatures. Similarly, circuit design innovations were needed because of the restricted list of parts. Voltage regulators, line drivers, voltage comparators, special purpose amplifiers and multiplexers were constructed and operated over the 25-300°C temperature range. Temperature and pressure monitoring instruments using these circuits have been used for downhole measurements in geothermal wells. Methods of fabrication, circuit performance, and the scope of future work are discussed.
  • Keywords
    Geothermal power generation; Hybrid integrated circuit thermal factors; Printed circuits; Thermal factors; Circuit synthesis; Commercialization; Instruments; Microelectronics; Silicon; Spine; Standards development; Technological innovation; Temperature distribution; Voltage;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1978.1135312
  • Filename
    1135312