Title :
Accurate measurement of reflectivity over wavelength of a laser diode antireflection coating using an external cavity laser
Author :
Stokes, Loren F.
Author_Institution :
Hewlett-Packard Lightwave Oper., Santa Rosa, CA, USA
fDate :
7/1/1993 12:00:00 AM
Abstract :
A method for measuring laser diode facet antireflection coating over wavelength is presented. The laser diode is coupled to a wavelength-selective external cavity, and laser threshold current over the wavelength region of interest is measured. The coating reflectivity over wavelength is derived from the threshold current data. Reflectivities as low as 1×10-5 have been measured with good fit over wavelength to an ideal single layer coating. The net external cavity feedback is also determined. An estimate of the accuracy of the reflectivity measurement is made
Keywords :
antireflection coatings; reflectivity; reflectometry; semiconductor lasers; coating reflectivity; external cavity laser; laser diode facet antireflection coating; laser threshold current; net external cavity feedback; reflectivity measurement; wavelength region; wavelength-selective external cavity; Coatings; Current measurement; Diode lasers; Laser feedback; Laser tuning; Reflectivity; Semiconductor device measurement; Threshold current; Waveguide lasers; Wavelength measurement;
Journal_Title :
Lightwave Technology, Journal of
