Accurate measurement of reflectivity over wavelength of a laser diode antireflection coating using an external cavity laser

Author

Stokes, Loren F.

Author_Institution

Hewlett-Packard Lightwave Oper., Santa Rosa, CA, USA

Volume

11

Issue

7

fYear

1993

fDate

7/1/1993 12:00:00 AM

Firstpage

1162

Lastpage

1167

Abstract

A method for measuring laser diode facet antireflection coating over wavelength is presented. The laser diode is coupled to a wavelength-selective external cavity, and laser threshold current over the wavelength region of interest is measured. The coating reflectivity over wavelength is derived from the threshold current data. Reflectivities as low as 1×10^-5 have been measured with good fit over wavelength to an ideal single layer coating. The net external cavity feedback is also determined. An estimate of the accuracy of the reflectivity measurement is made

Keywords

antireflection coatings; reflectivity; reflectometry; semiconductor lasers; coating reflectivity; external cavity laser; laser diode facet antireflection coating; laser threshold current; net external cavity feedback; reflectivity measurement; wavelength region; wavelength-selective external cavity; Coatings; Current measurement; Diode lasers; Laser feedback; Laser tuning; Reflectivity; Semiconductor device measurement; Threshold current; Waveguide lasers; Wavelength measurement;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.238077

Filename

238077