• DocumentCode
    956411
  • Title

    A generic resource distribution and test scheduling scheme for embedded core-based SoCs

  • Author

    Zhao, Dan ; Upadhyaya, Shambhu J.

  • Author_Institution
    Dept. of Comput. Sci. & Eng., State Univ. of New York, USA
  • Volume
    53
  • Issue
    2
  • fYear
    2004
  • fDate
    4/1/2004 12:00:00 AM
  • Firstpage
    318
  • Lastpage
    329
  • Abstract
    We present a novel test scheduling algorithm for embedded core-based system-on-chips based on a graph-theoretic formulation. Given a system integrated with a set of cores and a set of test resources, we select a test for each core from a set of alternative test sets, and schedule it in a way to evenly balance the resource usage and to ultimately reduce the test application time. Improvements to the basic algorithm are sought by grouping the cores and assigning higher priorities to those with smaller number of alternate test sets. The algorithm is also extended for solving the general test scheduling problem where multiple test sets are selected for each core from a set of alternatives to facilitate the testing for various fault models. A simulation study is performed to quantify the performance of the proposed scheduling approach.
  • Keywords
    built-in self test; graph theory; integrated circuit testing; scheduling; system-on-chip; BIST; DFT; IDDQ; SoC test scheduling; alternate test sets; built-in self test; design for testability; embedded core-based SoCs; fault models; general test scheduling problem; graph-theoretic formulation; multiple test sets; resource balancing; resource distribution; system-on-a-chip; system-on-chips; test application time reduction; test scheduling algorithm; test sets selection; Automatic testing; Built-in self-test; Costs; Design for testability; Job shop scheduling; Resource management; Scheduling algorithm; Shortest path problem; System testing; System-on-a-chip;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2003.822712
  • Filename
    1284861