Title :
A unified global and local interconnect test scheme for Xilinx XC4000 FPGAs
Author :
Sun, Xiaoling ; Trouborst, Pieter
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, Alta., Canada
fDate :
4/1/2004 12:00:00 AM
Abstract :
This paper presents a unified global and local interconnect testing scheme for field programmable gate arrays. Adjacency graphs are used to model interconnect resources and their test requirements, and an efficient computer algorithm for automatic derivation of test configurations is given. A device configuration generation tool was developed to reduce the test development cost.
Keywords :
field programmable gate arrays; integrated circuit interconnections; integrated circuit testing; FPGA; Xilinx XC4000 FPGAs; adjacency graphs; automatic test configuration derivation; computer algorithm; device configuration generation tool; field programmable gate arrays; global-local interconnect testing; interconnect resource modeling; test algorithm; test development; Automatic testing; Built-in self-test; Circuit testing; Field programmable gate arrays; Integrated circuit interconnections; Logic devices; Programmable logic arrays; Sun; System testing; Wire;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2003.822718
