DocumentCode
956526
Title
Failure Mechanism of High Energy Surge Resistors
Author
Hardy, L.H.
Author_Institution
The Carborundum Co.
Volume
1
Issue
1
fYear
1965
fDate
6/1/1965 12:00:00 AM
Firstpage
136
Lastpage
142
Abstract
Failure mechanisms of high power noninductive ceramic resistors in high energy, and in high voltage surge applications, have been investigated. These studies have determined the fundamental cause of failure to be that of thermal shock propagation caused by the discharge of large amounts of stored energy in a short period of time. When the surge energies are maintained at low levels, peak voltages of up to 445 kilovolts can be applied to the resistors without a significant change in resistance. The test studies, in conjunction with ar approximate theoretical expression for stress of a ceramic matrix due to thermal shock, show that the failure mechanism is a functior of 1. The joules of energy stored in the discharge capacitors. 2. The physical Geometry of the resistor. 3. The physical properties of the ceramic body. 4. The resistance of the body.
Keywords
Ceramics; Energy; High voltage; Power (VDD); Resistors; Surges; Capacitors; Ceramics; Electric shock; Failure analysis; Immune system; Low voltage; Resistors; Surges; Testing; Thermal stresses;
fLanguage
English
Journal_Title
Parts, Materials and Packaging, IEEE Transactions on
Publisher
ieee
ISSN
0018-9502
Type
jour
DOI
10.1109/TPMP.1965.1135347
Filename
1135347
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