• DocumentCode
    956526
  • Title

    Failure Mechanism of High Energy Surge Resistors

  • Author

    Hardy, L.H.

  • Author_Institution
    The Carborundum Co.
  • Volume
    1
  • Issue
    1
  • fYear
    1965
  • fDate
    6/1/1965 12:00:00 AM
  • Firstpage
    136
  • Lastpage
    142
  • Abstract
    Failure mechanisms of high power noninductive ceramic resistors in high energy, and in high voltage surge applications, have been investigated. These studies have determined the fundamental cause of failure to be that of thermal shock propagation caused by the discharge of large amounts of stored energy in a short period of time. When the surge energies are maintained at low levels, peak voltages of up to 445 kilovolts can be applied to the resistors without a significant change in resistance. The test studies, in conjunction with ar approximate theoretical expression for stress of a ceramic matrix due to thermal shock, show that the failure mechanism is a functior of 1. The joules of energy stored in the discharge capacitors. 2. The physical Geometry of the resistor. 3. The physical properties of the ceramic body. 4. The resistance of the body.
  • Keywords
    Ceramics; Energy; High voltage; Power (VDD); Resistors; Surges; Capacitors; Ceramics; Electric shock; Failure analysis; Immune system; Low voltage; Resistors; Surges; Testing; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Parts, Materials and Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9502
  • Type

    jour

  • DOI
    10.1109/TPMP.1965.1135347
  • Filename
    1135347