Gard - A New Era of Component Testing

This paper describes the GARD test theory and associated test instrument which is proposed as a means of economically replacing present burnin screening tests for resistive components. The total test requires approximately 5 seconds and offers a new and improved concept of temperature coefficient of resistance measurement in addition to the high reliability screening capability. This test is applicable to all types of resistive components including the resistive portions of integrated circuits and works on the principle of assuring component reliability by the identification of any failure modes that exist in a resistive system and could consequently cause or contribute to component failure.