• DocumentCode
    956663
  • Title

    ExPro-an expert system based process management system

  • Author

    Rastogi, Purag ; Kozicki, Michael N. ; Golshani, F.

  • Author_Institution
    Center for Solid State Electron. Res., Arizona State Univ., Tempe, AZ, USA
  • Volume
    6
  • Issue
    3
  • fYear
    1993
  • fDate
    8/1/1993 12:00:00 AM
  • Firstpage
    207
  • Lastpage
    218
  • Abstract
    The design, development and preliminary testing of ExPro, an expert-system-based process management system, is reported. This system is designed to provide process setup, monitoring, and supervisory control capabilities for applications in a real-time semiconductor manufacturing environment. ExPro is a rule-based system developed using the OPS-83 expert system language in a personal computer environment. It features a modular structure and includes an integrated analytical process simulator. The simulator is used to predict process parameters prior to processing and provide wafer state information from real-time (measured) process information when direct measurement of the state is impractical. The process selected for development and demonstration purposes was rapid thermal oxidation (RTO). Testing revealed that the accuracy of the system was within 1% of goal for the case of Si(100) wafers, but the less accurate Si(111) simulation led to much larger errors
  • Keywords
    computerised monitoring; expert systems; oxidation; process computer control; rapid thermal processing; semiconductor device manufacture; ExPro; OPS-83 expert system language; expert system; integrated analytical process simulator; modular structure; process management system; rapid thermal oxidation; real-time semiconductor manufacturing environment; rule-based system; supervisory control; wafer state information; Application software; Computational modeling; Computerized monitoring; Expert systems; Manufacturing processes; Process design; Real time systems; Semiconductor device manufacture; Supervisory control; System testing;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/66.238168
  • Filename
    238168