Comments on "Cryogenic noise parameter measurements of microwave devices"

Author

Wiatr, Wojciech

Author_Institution

Inst. of Electron. Syst., Warsaw Univ. of Technol., Poland

Volume

53

Issue

2

fYear

2004

fDate

4/1/2004 12:00:00 AM

Firstpage

619

Abstract

For original paper see Rolfes et al. (IEEE Trans. Instrum. Meas., vol.50, p.373-6, 2001 April). With regard to the original paper, the present author wishes to make remarks on the following statements presented in the abstract: "In contrast to existing concepts, the seven-state method makes it possible to determine the minimum noise figure F/sub min/ and the equivalent noise resistance R/sub n/, except for a constant term m with the help of noise power measurements with a noise source operated at ambient temperature only. The optimum generator admittance Y/sub opt/ and the input admittance Y/sub in/ of the device under test are completely calculable from cold noise power measurements. An additional measurement of Y/sub in/ with a network vector analyzer as needed for other techniques is not necessary.".

Keywords

cryogenic electronics; electric noise measurement; microwave devices; semiconductor device noise; DUT; calibrated noise source; cold termination measurement; constrained least-squares optimization; cryogenic fixture; cryogenic noise parameter measurement; cryogenic noise parameter measurements; eight-term linear model; eight-term model; isothermal calibration; isothermal linear model; isothermal measurement; isothermal model; microwave devices; multistate radiometer system; multistate radiometry; network vector analyzer; noise characterization; noise contribution; noise determination; noise measurement; noise parameter measurement; noise parameters; noise power measurements; noise source; noise temperature; radiometer calibration; radiometer system; seven-state method; vector network analyzer; Admittance; Cryogenics; Microwave devices; Microwave measurements; Noise figure; Noise measurement; Optimized production technology; Power generation; Power measurement; Temperature;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2004.823649

Filename

1284900