DocumentCode :
956844
Title :
Comments on "Cryogenic noise parameter measurements of microwave devices"
Author :
Wiatr, Wojciech
Author_Institution :
Inst. of Electron. Syst., Warsaw Univ. of Technol., Poland
Volume :
53
Issue :
2
fYear :
2004
fDate :
4/1/2004 12:00:00 AM
Firstpage :
619
Abstract :
For original paper see Rolfes et al. (IEEE Trans. Instrum. Meas., vol.50, p.373-6, 2001 April). With regard to the original paper, the present author wishes to make remarks on the following statements presented in the abstract: "In contrast to existing concepts, the seven-state method makes it possible to determine the minimum noise figure F/sub min/ and the equivalent noise resistance R/sub n/, except for a constant term m with the help of noise power measurements with a noise source operated at ambient temperature only. The optimum generator admittance Y/sub opt/ and the input admittance Y/sub in/ of the device under test are completely calculable from cold noise power measurements. An additional measurement of Y/sub in/ with a network vector analyzer as needed for other techniques is not necessary.".
Keywords :
cryogenic electronics; electric noise measurement; microwave devices; semiconductor device noise; DUT; calibrated noise source; cold termination measurement; constrained least-squares optimization; cryogenic fixture; cryogenic noise parameter measurement; cryogenic noise parameter measurements; eight-term linear model; eight-term model; isothermal calibration; isothermal linear model; isothermal measurement; isothermal model; microwave devices; multistate radiometer system; multistate radiometry; network vector analyzer; noise characterization; noise contribution; noise determination; noise measurement; noise parameter measurement; noise parameters; noise power measurements; noise source; noise temperature; radiometer calibration; radiometer system; seven-state method; vector network analyzer; Admittance; Cryogenics; Microwave devices; Microwave measurements; Noise figure; Noise measurement; Optimized production technology; Power generation; Power measurement; Temperature;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2004.823649
Filename :
1284900
Link To Document :
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