Title :
Comments on "Application of the Eyring Model to Capacitor Aging Data"
Author :
Gottfried, P. ; Endicott, H.
Author_Institution :
Booz-Allen Applied Research, Inc.,Bethesda, MD
fDate :
12/1/1965 12:00:00 AM
Keywords :
Aging; Capacitors; Constraint theory; Equations; Extrapolation; Shape; Stress; Testing; Voltage; Weibull distribution;
Journal_Title :
Parts, Materials and Packaging, IEEE Transactions on
DOI :
10.1109/TPMP.1965.1135398
