DocumentCode

957035

Title

Comments on "Application of the Eyring Model to Capacitor Aging Data"

Author

Gottfried, P. ; Endicott, H.

Author_Institution

Booz-Allen Applied Research, Inc.,Bethesda, MD

Volume

1

Issue

3

fYear

1965

fDate

12/1/1965 12:00:00 AM

Firstpage

40

Lastpage

40

Keywords

Aging; Capacitors; Constraint theory; Equations; Extrapolation; Shape; Stress; Testing; Voltage; Weibull distribution;

fLanguage

English

Journal_Title

Parts, Materials and Packaging, IEEE Transactions on

Publisher

ieee

ISSN

0018-9502

Type

jour

DOI

10.1109/TPMP.1965.1135398

Filename

1135398