Title :
Transparent Thin-Film Transistors Using ZnMgO as Dielectrics and Channel
Author :
Wu, Huizhen ; Liang, Jun ; Jin, Guofen ; Lao, Yanfeng ; Xu, Tianning
Author_Institution :
Zhejiang Univ., Hangzhou
Abstract :
An enhancement-mode ZnMgO transparent thin-film transistor (TFT) is fabricated, in which cubic-phase ZnMgO (C-ZnMgO) is used as gate insulator and hexagonal-phase ZnMgO (H-ZnMgO) is used as channel. The multilayers of C-ZnMgO and H-ZnMgO are grown on patterned indium-tin-oxide-coated glass in successive fashion at low temperature. Capacitor-voltage characteristics measured across the gate show that the H-ZnMgO channel is n-type. The C-ZnMgO isolating layer demonstrates low leakage current characteristics, i.e., 4 times 10-7 A/cm2, at a bias of 10 V. The transparent TFTs display a typical channel mobility of 1.5 cm2 V-1 s-1 and an on/off ratio of 104.
Keywords :
insulators; leakage currents; magnesium; thin film capacitors; thin film transistors; zinc compounds; ZnMgO - System; capacitor-voltage characteristics; channel mobility; gate dielectrics; gate insulator; leakage current; transparent thin-film transistor; voltage 10 V; Amorphous silicon; Dielectric materials; Dielectrics and electrical insulation; Glass; Leakage current; Photonic band gap; Temperature; Thin film transistors; Vacuum systems; Zinc oxide; High-$kappa$ gate dielectrics; ZnMgO; transparent thin-film transistors (TFTs);
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2007.907126