Title :
On the determination of device noise and gain parameters
Author_Institution :
Università di Palermo, Palermo, Italy
Abstract :
The least-squares fitting of measured noise figures and gains versus input termination admittance is an established procedure to determine linear two-port noise and gain parameters. Unfortunately, the method is liable to the serious inconvenience of yielding often erroneous results or even results without physical meaning. Some criteria are suggested which allow the carrying out of measurements in such a manner as to safely avoid the above drawbacks.
Keywords :
Admittance; Circuit noise; Electrons; Impedance; Network synthesis; Noise figure; Operational amplifiers; Signal synthesis; Transfer functions; Voltage;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1979.11458
