DocumentCode :
957415
Title :
Optimisation of p+ doping level of n+-p-p+ bifacial b.s.f. solar cells by ion implantation
Author :
Eguren, J. ; del Alamo, Jesus ; Luque, Antonio
Author_Institution :
Universidad Politécnica de Madrid, Laboratorio de Semiconductores, Instituto de EnergÃ\xada Solar, Madrid, Spain
Volume :
16
Issue :
16
fYear :
1980
Firstpage :
633
Lastpage :
634
Abstract :
High-low junctions of n+-p-p+ bifacial back surface field solar cells have been fabricated by B11+ implantation. After an isothermal annealing step at 900°C for 10 min, an optimum surface concentration of 5 × 1019 cm¿3 is observed. Its origin is found to lie in the partial electrical activation of the implanted impurities.
Keywords :
annealing; ion implantation; optimisation; semiconductor doping; solar cells; bifacial back surface field solar cells; doping level; electrical activation; ion implantation; isothermal annealing; optimisation; surface concentration;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19800439
Filename :
4244212
Link To Document :
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