Title :
Diagnostic testing of a 10-kbit bubble memory chip
Author :
Orihara, Shobu ; Iwasa, Seiichi ; Majima, Teiji ; Nogiwa, Kengo ; Yamagishi, Kazuo
Author_Institution :
Fujitsu Laboratories, Ltd., Kawasaki, Japan
fDate :
11/1/1975 12:00:00 AM
Abstract :
A 10-kbit bubble memory chip has been designed and fabricated. Testing was accomplished using a new diagnostic test system, which can drive the bubble chip at two different speeds with bias fields switched synchronously with the bubble propagation. Bias margins of the fabricated chips were analyzed and it was confirmed that a sufficient bias-margin window could be assured in long-term operation.
Keywords :
Magnetic bubble memories; Memory testing; Chip scale packaging; Circuit testing; Conducting materials; Conductive films; Detectors; Frequency; Magnetic analysis; Magnetic field measurement; Milling; System testing;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1975.1058968
