• DocumentCode
    957608
  • Title

    Diagnostic testing of a 10-kbit bubble memory chip

  • Author

    Orihara, Shobu ; Iwasa, Seiichi ; Majima, Teiji ; Nogiwa, Kengo ; Yamagishi, Kazuo

  • Author_Institution
    Fujitsu Laboratories, Ltd., Kawasaki, Japan
  • Volume
    11
  • Issue
    6
  • fYear
    1975
  • fDate
    11/1/1975 12:00:00 AM
  • Firstpage
    1685
  • Lastpage
    1688
  • Abstract
    A 10-kbit bubble memory chip has been designed and fabricated. Testing was accomplished using a new diagnostic test system, which can drive the bubble chip at two different speeds with bias fields switched synchronously with the bubble propagation. Bias margins of the fabricated chips were analyzed and it was confirmed that a sufficient bias-margin window could be assured in long-term operation.
  • Keywords
    Magnetic bubble memories; Memory testing; Chip scale packaging; Circuit testing; Conducting materials; Conductive films; Detectors; Frequency; Magnetic analysis; Magnetic field measurement; Milling; System testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1975.1058968
  • Filename
    1058968
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=957608