DocumentCode :
957693
Title :
Dielectric properties of the surface layer in ultra-thin films of a VDF/TrFE copolymer
Author :
Takahashi, Yoshiyuki ; Kitahama, Akira ; Furukawa, Takeo
Author_Institution :
Dept. of Chem., Tokyo Univ. of Sci., Japan
Volume :
11
Issue :
2
fYear :
2004
fDate :
4/1/2004 12:00:00 AM
Firstpage :
227
Lastpage :
231
Abstract :
We measured the temperature and frequency dispersion of the permittivity of vinylidene fluoride and trifluoroethylene (VDF/TrFE) thin films spin-coated on glass substrates with evaporated aluminium electrodes. Assuming the existence of two surface layers with different dielectric properties from the bulk material, a thickness of 2 nm was deduced for each surface layer. The temperature dependence of the frequency dispersion of the permittivity of the surface layers was obtained. Each surface layer has a dielectric relaxation which is essentially the same as the segment mode of the amorphous region of the bulk. It shows no anomaly at the temperature of the paraelectric-ferroelectric phase transition for thick samples. The surface layers appear to be amorphous.
Keywords :
dielectric relaxation; ferroelectric thin films; ferroelectric transitions; permittivity; polymer blends; polymer films; temperature measurement; 2 nm; aluminium electrode; bulk material; dielectric permittivity; dielectric relaxation; frequency dispersion; glass substrate; paraelectric-ferroelectric phase transition; surface layer; temperature measurement; trifluoroethylene; ultra-thin copolymer film; vinylidene fluoride; Aluminum; Amorphous materials; Dielectric measurements; Dielectric substrates; Dielectric thin films; Dispersion; Frequency measurement; Glass; Permittivity measurement; Temperature measurement;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2004.1285891
Filename :
1285891
Link To Document :
بازگشت