Title :
Self-aligned AlGaAs/InGaAs/GaAs collector-up heterojunction bipolar transistors for microwave applications
Author :
Chang, M.F. ; Sheng, N.H. ; Asbeck, P.M. ; Sullivan, G.J. ; Wang, K.C. ; Anderson, R.J. ; Higgins, J.A.
Author_Institution :
Rockwell Int. Sci. Center, Thousand Oaks, CA, USA
fDate :
11/1/1989 12:00:00 AM
Abstract :
Summary form only given. The authors discuss the recent development of high-performance AlGaAs/InGaAs/GaAs collector-up HBTs (heterojunction bipolar transistors) fabricated by using a novel self-aligned base/collector process. Transistors with collector widths down to 2.6 mu m and base doping up to 1*1020/cm3 have been fabricated and tested. Based on s-parameters measured up to 26 GHz, an extrapolated current gain bandwidth, ft, of 65 GHz and a maximum frequency of oscillation, fmax, of 102 GHz have been obtained. To the authors´ knowledge, these are the first C-up HBTs demonstrated to operate at or above microwave frequencies.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; indium compounds; semiconductor technology; solid-state microwave devices; 2.6 micron; 26 to 102 GHz; AlGaAs-InGaAs-GaAs; EHF; base doping; collector widths; collector-up HBTs; current gain bandwidth; fmax; ft; heterojunction bipolar transistors; maximum frequency of oscillation; microwave frequencies; s-parameters; self-aligned transistors; Current measurement; Doping; Frequency measurement; Gain measurement; Gallium arsenide; Heterojunction bipolar transistors; Indium gallium arsenide; Microwave transistors; Scattering parameters; Testing;
Journal_Title :
Electron Devices, IEEE Transactions on