DocumentCode :
957889
Title :
2006 Best Paper Award
Author :
Boning, Duane S.
Volume :
20
Issue :
4
fYear :
2007
Firstpage :
341
Lastpage :
342
Abstract :
The IEEE Transactions on Semiconductor Manufacturing awarded the 2006 Best Paper Award to T. Pfingsten and D.J.L. Herrmann for their paper, "Model-based design analysis and yield optmization."
Keywords :
Awards;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/TSM.2007.910546
Filename :
4369325
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=957889
