DocumentCode
957918
Title
Using Rough Set Theory to Recruit and Retain High-Potential Talents for Semiconductor Manufacturing
Author
Chien, Chen-Fu ; Chen, Li-Fei
Author_Institution
Nat. Tsing Hua Univ., Hsinchu
Volume
20
Issue
4
fYear
2007
Firstpage
528
Lastpage
541
Abstract
To recruit and retain high-potential talent is critical for semiconductor companies to maintain competitive advantages in a modern knowledge-based economy. Conventional personnel selection methodologies focusing on static work and job analysis will no longer be appropriate for knowledge workers in high-tech industries. This paper aims to develop an effective data mining approach based on Rough Set Theory to explore and analyze human resource data for personnel selection and human capital enhancement. An empirical study was conducted in a leading semiconductor company in Taiwan to estimate the validity of the proposed approach for predicting work behaviors including performance and resignation. The results showed that latent knowledge can be discovered as a basis to derive specific recruitment and human resource management strategies. In particular, 29 rules have been adopted as references for recruiting the right talent. This paper concludes with discussions of empirical findings and future research directions.
Keywords
data mining; knowledge based systems; personnel; recruitment; rough set theory; semiconductor device manufacture; data mining approach; human capital enhancement; human resource data; human resource management strategy; job analysis; knowledge-based economy; personnel selection methodology; recruitment; rough set theory; semiconductor company; semiconductor manufacturing; Data analysis; Data mining; Human resource management; Lead compounds; Manufacturing industries; Personnel; Recruitment; Semiconductor device manufacture; Set theory; Testing; Competitive advantage; data mining; decision analysis; human capital; personnel selection; rough set theory (RST);
fLanguage
English
Journal_Title
Semiconductor Manufacturing, IEEE Transactions on
Publisher
ieee
ISSN
0894-6507
Type
jour
DOI
10.1109/TSM.2007.907630
Filename
4369329
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