DocumentCode
957931
Title
Alpha Emission Measurements of Lids and Solder Preforms on Semiconductor Packages
Author
Levine, Samuel W.
Author_Institution
Semi-Alloys,NY
Volume
2
Issue
4
fYear
1979
fDate
12/1/1979 12:00:00 AM
Firstpage
391
Lastpage
395
Abstract
Measurements of the alpha emission activity of metal lids manufactured for the hermetic sealing of semiconductor packages indicate that the activity level is less than 0.05 counts/h/cm2. Probably, the alpha emission activity is in the area of 0.01 counts/h/cm2. This low level of alpha emission is made possible by the use of a chelating compound in the electroplating hath used for plating the lids. Base metal from which the lids are manufactured is monitored for alpha emission before plating. Only that base metal is used which has extremely low level activity. A graphical representation of the counting statistics for measuring alpha emission is developed in such a way as to be most convenient for use in the Quality Control Department of the manufacturer and user of the lids.
Keywords
Alpha particles; Semiconductor device packaging; Alpha particles; Ceramics; Electronics packaging; Gold; Ionizing radiation; Manufacturing; Nickel; Preforms; Semiconductor device manufacture; Semiconductor device packaging;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1979.1135489
Filename
1135489
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