Title :
Fabrication of Passive Components for High Temperature Instrumentation
Author :
Raymond, Leonard S. ; Nelson, Louis N. ; Hamilton, Douglas J. ; Kerwin, William J.
Author_Institution :
U. of Arizona;Tucson, AZ
fDate :
12/1/1979 12:00:00 AM
Abstract :
Thin-film resistors and capacitors have been fabricated for use in geothermal well-logging tools. The resistors can operate from 25°C-500°C with a temperature coefficient below 100 ppm/°C; capacitors can operate from 25°C-350°C with a similar temperature coefficient. Chemical vapor deposition (CVD) is used to fabricate both resistors and capacitors. The processing is compatible with most microcircuit processes; and resistors, capacitors, interconnecting metallization, and possivation are all produced by CVD and can be integrated on a single substrate. Resistor material is tungsten-silicon, capacitor electrodes and metallization are tungsten, and dielectric material is silicon nitride. Photolithography is used to delineate component geometry.
Keywords :
Geothermal power generation; Thin-film capacitor fabrication; Thin-film resistor fabrication; Capacitors; Chemical vapor deposition; Dielectric materials; Dielectric substrates; Fabrication; Instruments; Metallization; Resistors; Temperature; Transistors;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCHMT.1979.1135490