DocumentCode
957965
Title
Pad Conditioning Density Distribution in CMP Process With Diamond Dresser
Author
Feng, Tyan
Author_Institution
Tamkang Univ., Tamsui
Volume
20
Issue
4
fYear
2007
Firstpage
464
Lastpage
475
Abstract
In the chemical-mechanical polishing (CMP) process, the pad conditioning density distribution plays a crucial role in the pad wear. A precise model and detailed analysis of a conditioning density function are required. To this end, at first we construct the mathematical model of polishing trajectories on the pad, then under the assumptions that the diamond grains are uniformly distributed and a slow sweeping motion is applied during dressing, the conditioning density distribution for a pad in CMP process is determined. This conditioning density function is verified through numerous numerical examples. In the mean time, it was also observed that to have a flat distribution of pad wear rate we have to make the ratio of disk-radius to pad-radius small, and the effect of the pattern of grain distribution on conditioning density function is insignificant, which agrees with known results from literature.
Keywords
chemical mechanical polishing; diamond; wear; chemical-mechanical polishing; diamond dresser; diamond grains; mathematical model; pad conditioning density distribution; pad wear; Abrasives; Chemical processes; Chemical technology; Density functional theory; Equations; Mathematical model; Polymers; Semiconductor device manufacture; Semiconductor device modeling; Slurries; Chemical–mechanical polishing (CMP); Preston equation; conditioning density; diamond dresser; pad dressing;
fLanguage
English
Journal_Title
Semiconductor Manufacturing, IEEE Transactions on
Publisher
ieee
ISSN
0894-6507
Type
jour
DOI
10.1109/TSM.2007.907618
Filename
4369334
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