Title :
Early voltage uniqueness test for bipolar junction transistors
Author_Institution :
North East London Polytechnic, Faculty of Engineering, Dagenham, UK
Abstract :
A technique is described for the direct visual comparison of the common emitter output characteristic¿at a chosen collector current, in the forward active mode¿of a junction transistor subjected alternately to base-emitter voltage drive and base current drive. The Early effect is characterised by a unique parameter, the Early voltage, only if the two curves can be shown to exhibit coincidence in the nonsaturated region.
Keywords :
bipolar transistors; semiconductor device testing; Early effect; Early voltage uniqueness; bipolar junction transistor; common emitter output characteristic; semiconductor device testing;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19800499