• DocumentCode
    957987
  • Title

    Early voltage uniqueness test for bipolar junction transistors

  • Author

    Hart, B.L.

  • Author_Institution
    North East London Polytechnic, Faculty of Engineering, Dagenham, UK
  • Volume
    16
  • Issue
    18
  • fYear
    1980
  • Firstpage
    703
  • Lastpage
    705
  • Abstract
    A technique is described for the direct visual comparison of the common emitter output characteristic¿at a chosen collector current, in the forward active mode¿of a junction transistor subjected alternately to base-emitter voltage drive and base current drive. The Early effect is characterised by a unique parameter, the Early voltage, only if the two curves can be shown to exhibit coincidence in the nonsaturated region.
  • Keywords
    bipolar transistors; semiconductor device testing; Early effect; Early voltage uniqueness; bipolar junction transistor; common emitter output characteristic; semiconductor device testing;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19800499
  • Filename
    4244274