• DocumentCode
    958032
  • Title

    Quantitative Comparison of Electronic Component/Solder Joint Stress Relief in Encapsulated Assemblies

  • Author

    Cummings, Dennis A.

  • Author_Institution
    Bendix Corp.,Kansas City, MO
  • Volume
    2
  • Issue
    4
  • fYear
    1979
  • fDate
    12/1/1979 12:00:00 AM
  • Firstpage
    454
  • Lastpage
    459
  • Abstract
    A quantiative comparison was made of various stress relief bends with and without sleeving in three commonly used encapsulants. Silicone rubber and heat shrinkable polyolifin sleeving were used on right angle, full loop, and hump style lead bends. Small (from 254mum to 762mum diameter) and large (762 mum to 1.27 mm diameter) wires were used to simulate small and large component leads. The component leads were encapsulated in microballoon-filled epoxy, 128 kg/m3urethane foam, and 320 kg/m3urethane foam. Ten test samples were fabricated in each configuration; five were used for tensile loading, and five were used for compressive loading.
  • Keywords
    Mechanical factors; Packaging; Assembly; Circuit testing; Compressive stress; Electronic components; Lead; Printed circuits; Soldering; Tensile stress; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1979.1135500
  • Filename
    1135500