DocumentCode :
958032
Title :
Quantitative Comparison of Electronic Component/Solder Joint Stress Relief in Encapsulated Assemblies
Author :
Cummings, Dennis A.
Author_Institution :
Bendix Corp.,Kansas City, MO
Volume :
2
Issue :
4
fYear :
1979
fDate :
12/1/1979 12:00:00 AM
Firstpage :
454
Lastpage :
459
Abstract :
A quantiative comparison was made of various stress relief bends with and without sleeving in three commonly used encapsulants. Silicone rubber and heat shrinkable polyolifin sleeving were used on right angle, full loop, and hump style lead bends. Small (from 254mum to 762mum diameter) and large (762 mum to 1.27 mm diameter) wires were used to simulate small and large component leads. The component leads were encapsulated in microballoon-filled epoxy, 128 kg/m3urethane foam, and 320 kg/m3urethane foam. Ten test samples were fabricated in each configuration; five were used for tensile loading, and five were used for compressive loading.
Keywords :
Mechanical factors; Packaging; Assembly; Circuit testing; Compressive stress; Electronic components; Lead; Printed circuits; Soldering; Tensile stress; Thermal expansion; Thermal stresses;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1979.1135500
Filename :
1135500
Link To Document :
بازگشت