Title :
Prediction of flip-flop behaviour in metastable state
Author :
Lacroix, G. ; Marchegay, Ph. ; al Hossri, N.
Author_Institution :
Université de Bordeaux I, Equipe Systemes Electroniques Logiques, Talence, France
Abstract :
Two easy experimental measurements carried out on the fundamental gate of a logic family are presented which allow us to foresee the behaviour of the same technology latch circuit in its metastable state produced by a marginal triggering.
Keywords :
flip-flops; logic circuits; flip flop behaviour; fundamental gate; latch circuit; logic family; marginal triggering; metastable state;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19800515
