Transformations and resynthesis for testability of RT-level control-data path specifications

This paper introduces a technique to transform a given register-transfer level (RT-level) design, consisting of control logic and data path, into a functionally equivalent, minimized design which is 100% testable under full-scan at the gate level. The proposed RT-level optimization technique uses the RT-level structure and exploits the interaction between the control and the data path. Our approach maintains the RT-level design hierarchy while performing RT-level transformations of initially specified data path, followed by resynthesis of control using don´t cares extracted from the data path. Experiments with several RTL benchmarks demonstrate the effectiveness of the technique in generating fully testable designs. In addition, comparison with logic-level techniques show the advantages of the proposed technique as an optimizing tool to produce circuits with reduced area and delay.<>